- Title
- A highly contrasting scanning helium microscope
- Creator
- Fahy, A.; Barr, M.; Martens, J.; Dastoor, P. C.
- Relation
- Review of Scientific Instruments Vol. 86, Issue 2
- Publisher Link
- http://dx.doi.org/10.1063/1.4907539
- Publisher
- American Institute of Physics
- Resource Type
- journal article
- Date
- 2015
- Description
- We present a scanning helium microscope equipped to make use of the unique contrast mechanisms, surface sensitivity, and zero damage imaging the technique affords. The new design delivers an order of magnitude increase in the available helium signal, yielding a higher contrast and signal-to-noise ratio. These improvements allow the microscope to produce high quality, intuitive images of samples using topological contrast, while setting the stage for investigations into further contrast mechanisms. © American Institute of Physics
- Subject
- image sensors; particle beam detectors; electron microscopes; high pressure; atom scattering
- Identifier
- http://hdl.handle.net/1959.13/1061690
- Identifier
- uon:16997
- Identifier
- ISSN:0034-6748
- Language
- eng
- Full Text
- Reviewed
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